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====== Technology library ====== | ====== Technology library ====== | ||
^ Title ^ Author ^ Journal ^ Date ^ | ^ Title ^ Author ^ Journal ^ Date ^ | ||
- | | A unified look at the use of successive differentiation and integration in MOSFET model parameter extraction | F. J. Garcia-Sanchez, A. Ortiz-Conde, J. Munci, A. Sucre-Gonzalez, J.J. Liou | Microelectronics Reliability | 2015 | | + | | {{:docs:lib:technology:mr_55_293.pdf|A unified look at the use of successive differentiation and integration in MOSFET model parameter extraction}} | F. J. Garcia-Sanchez, A. Ortiz-Conde, J. Munci, A. Sucre-Gonzalez, J.J. Liou | Microelectronics Reliability | 2015 | |