This shows you the differences between two versions of the page.
| Next revision | Previous revision | ||
|
docs:lib:technology:start [2015/01/25 19:44] dominik.przyborowski created |
docs:lib:technology:start [2019/03/08 14:08] (current) |
||
|---|---|---|---|
| Line 1: | Line 1: | ||
| ====== Technology library ====== | ====== Technology library ====== | ||
| ^ Title ^ Author ^ Journal ^ Date ^ | ^ Title ^ Author ^ Journal ^ Date ^ | ||
| - | | A unified look at the use of successive differentiation and integration in MOSFET model parameter extraction | F. J. Garcia-Sanchez, A. Ortiz-Conde, J. Munci, A. Sucre-Gonzalez, J.J. Liou | Microelectronics Reliability | 2015 | | + | | {{:docs:lib:technology:mr_55_293.pdf|A unified look at the use of successive differentiation and integration in MOSFET model parameter extraction}} | F. J. Garcia-Sanchez, A. Ortiz-Conde, J. Munci, A. Sucre-Gonzalez, J.J. Liou | Microelectronics Reliability | 2015 | |