====== Technology library ======
^  Title  ^  Author  ^  Journal  ^  Date  ^
|  {{:docs:lib:technology:mr_55_293.pdf|A unified look at the use of successive differentiation and integration in MOSFET model parameter extraction}}  |  F. J. Garcia-Sanchez, A. Ortiz-Conde, J. Munci, A. Sucre-Gonzalez, J.J. Liou  |  Microelectronics Reliability  |  2015  |