docs:lib:technology:start
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Technology library
| Title | Author | Journal | Date |
|---|---|---|---|
| A unified look at the use of successive differentiation and integration in MOSFET model parameter extraction | F. J. Garcia-Sanchez, A. Ortiz-Conde, J. Munci, A. Sucre-Gonzalez, J.J. Liou | Microelectronics Reliability | 2015 |
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